Deflectors - Near IR
Model | A/R Coating | Mat'l | Rayleigh Res'n 1 2 |
Aperture (mm) HxW | Sweep BW (MHz) | Center Freq. (MHz) | Driver | Feature |
D110-T50S-4 | NIR | TeO2 (S) | 550 | 4 x 14 | 25 | 50 | Here | |
D110-T50S-9 | NIR | TeO2 (S) | 375 | 4 x 14 | 25 | 50 | Here | |
D110-T70S-6 | 1um | TeO2 (S) | 350 | 6.3 | 35 | 70 | Here | |
OAD1343-T70S-9 | 0.7-0.9um | TeO2 (S) | 395 | 9 | 30 | 70 | Here | |
OAD1344-T70S-9 | 0.8-1.0um | TeO2 (S) | 395 | 9 | 30 | 70 | Here | |
D55-T80S-2 | NIR | TeO2 (S) | 450 | 2 x 7 | 40 | 80 | Here | |
D804-P80L-2 | 0.7-0.9um | PbMoO4 | 66 | 2 x 6 | 40 | 80 | Here | |
D926-P145L-0.5 | 1um | PbMoO4 | 60 | 0.5 x 3 | 70 | 145 | Here | |
D943-P185L-2 | 0.7-0.9um | PbMoO4 | 190 | 2 x 6 | 120 | 185 | Here | |
D1312-T80L-6 | NIR | TeO2 | 40 | 6 | 30 | 80 | Here | High Pwr |
D1412-T80L-3 | NIR | TeO2 | 40 | 3 x 6 | 30 | 80 | Here | Conduction cooled |
D1422-T85L-4 | 1um | TeO2 | 40 | 4 x 8 | 30 | 85 | Here | |
D1135-T110L-4 | 1um | TeO2 | 95 | 4 x 8 | 50 | 110 | Here | |
D1346-aQ80L-4,-6 | 1um | Quartz | 20 | 4 x 6 | 25 | 80 | Here | |
OAD1550-XY-T40S-7 | 1.55um | TeO2 (S) | 200 x 200 | 7 x 7 | 20 | 40 | Here | Dual Axis |
DXY110-T50S-9 | NIR | TeO2 (S) | 240 x 240 | 6 x 6 | 25 | 50 | Here | Dual Axis |
OAD1343-XY-T70S-9 | 0.7-0.9um | TeO2 (S) | 400 X 400 | 9 X 9 | 30 | 70 | Here | Dual Axis |
OAD1344-XY-T70S-9 | 0.8-1.0um | TeO2 (S) | 400 X 400 | 9 X 9 | 30 | 70 | Here | Dual Axis |
D1422-XY-T85L-4 | 1um | TeO2 | 20 x 20 | 4 x 4 | 30 | 85 | Here | Dual Axis |
1 Rayleigh Resolution equates to the maximum number of optically resolvable spots (angles) alone a scan line.
2 Incremental resolution is infinite, limited only by the frequency resolution of the RF driver.